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Publication Type:
| Trade |
Author(s): | Fech, John C. |
Author Affiliation: | Contributing Editor, Superintendent and Horticulturist and Certified Arborist, University of Nebraska-Lincoln Extension |
Title: | Resistance management requires cultural practices, chemical rotation: Detailed audits of application efficacy must be part of resistance management protocols and IPM plans |
Column Name: | Control center: Course management tips Other records with the "Control center: Course management tips" Column
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Source: | Superintendent. Vol. 16, No. 3, March 2017, p. 18-20, 22-23. |
Publishing Information: | Birmingham, Alabama: Grand View Media |
# of Pages: | 5 |
Keywords: | TIC Keywords: Cultural methods; Integrated pest management; Nomenclature; Pesticide application; Pesticide efficacy; Pesticide resistance
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Language: | English |
References: | 0 |
Note: | Pictures, color |
| ASA/CSSA/SSSA Citation (Crop Science-Like - may be incomplete): Fech, J. C. 2017. Resistance management requires cultural practices, chemical rotation: Detailed audits of application efficacy must be part of resistance management protocols and IPM plans. Superintendent. 16(3):p. 18-20, 22-23. |
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